Published May 15, 2005
| Version v1
Journal article
Room-temperature growth of epitaxial (111) Fe3O4 films with conductive Cu underlayer
- 1. Department of Engineering and System Science, National Tsing Hua University, 300 HsinChu, Taiwan (China)
- 2. Department of Materials Science and Engineering, National Tsing Hua University, 300 HsinChu, Taiwan (China)
Description
Epitaxial (111) Fe3O4 film on the Cu underlayer was obtained by using reactive ion-beam sputtering with high incident energy at room temperature. X-ray φ scans and transmission electron microscope diffraction pattern revealed unusual 12-fold symmetry of the (111) Fe3O4 films on Cu (001) underlayers due to the presence of two kinds of epitaxial (111) grains in Fe3O4 films. The saturation magnetization of the 70 nm thick (111) Fe3O4 films is 291 emu/cm3. A clear Verwey transition of Fe3O4 films was observed around 116 K. The root-mean-square roughness of the Fe3O4 surface is only 3.5 A
Additional details
Identifiers
- DOI
- 10.1063/1.1854453;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 97
- Journal Issue
- 10
- Journal Page Range
- p. 10C311-10C311.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 49. annual conference on magnetism and magnetic materials
- Dates
- 7-11 Nov 2004
- Place
- Jacksonville, FL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37024055
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPPER; CRYSTAL GROWTH; DEPOSITION; EPITAXY; FERROMAGNETIC MATERIALS; FILMS; INTERFACES; ION BEAMS; IRON OXIDES; LAYERS; MAGNETISM; MAGNETIZATION; ROUGHNESS; SPUTTERING; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SURFACE PROPERTIES; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2005 American Institute of Physics