Published September 2009
| Version v1
Journal article
Formation of phases in the films of a Ag-In-Se system
Creators
- 1. Azerbaijan National Academy of Sciences, Institute of Physics (Azerbaijan)
Description
Processes of electron-diffraction structure analysis have been used to study the processes of phase formation and phase transitions in thin layers of a Ag-In-Se system. The phases formed at the onset of interaction between the films and phase transformations occurring during annealing of the samples in vacuum are established. It is found that thin films of the AgInSe2 compound formed as a result of simultaneous or consecutive deposition of components are amorphous, and crystallization brings about the formation of textured films with high structural quality
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 43
- Journal Issue
- 9
- Journal Page Range
- p. 1111-1114
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43040231
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CRYSTALLIZATION; DEPOSITION; ELECTRON DIFFRACTION; INTERACTIONS; THIN FILMS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; FILMS; HEAT TREATMENTS; PHASE TRANSFORMATIONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2009 Pleiades Publishing, Ltd.