Published February 1, 2017 | Version v1
Journal article

Non-destructive testing of nanomaterials by using subminiature eddy current transducers

  • 1. Altay State University, 61, Lenin str., Barnaul, 656049 (Russian Federation)
  • 2. Altay State Agrarian University, 98, Krasnoarmeyskiy ave., Barnaul, 656049 (Russian Federation)
  • 3. Novosibirsk State Technical University, 20, Karka Marksa ave., Novosibirsk, 630073 (Russian Federation)

Description

A sensor for studying nanomaterials has been developed on the basis of a transformer-type eddy-current transducer. The basic technical data are stated (the number of windings is 100-400 turns, and the value of the initial permeability of the core is µmax = 36000). Measurements technique which allows high-precision measuring the electrical conductivity in thin film Ce-Nb. The electrical conductivity of Niobium-Selenium varies from 3.3·105 to 3.7·105 MS/m in the ratio of four from 4 to 60 nm. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/177/1/012111

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
177
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1757-899X

Conference

Title
International conference on mechanical engineering, automation and control systems 2016
Dates
27-29 Oct 2016
Place
Tomsk (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49077494
Subject category
S42: ENGINEERING; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; EDDY CURRENTS; ELECTRIC CONDUCTIVITY; NANOMATERIALS; NIOBIUM; NONDESTRUCTIVE TESTING; PERMEABILITY; SELENIUM; SENSORS; THIN FILMS; TRANSDUCERS; TRANSFORMERS
Descriptors DEC
CURRENTS; ELECTRIC CURRENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTS; EQUIPMENT; FILMS; MATERIALS; MATERIALS TESTING; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; SEMIMETALS; TESTING; TRANSITION ELEMENTS