Published April 2005 | Version v1
Journal article Metadata-only

SIMS measurements of oxygen content in the Nd2Fe14B phase

Creators

  • 1. IFW Dresden, Postfach 270116, D-01171 Dresden (Germany)
  • 2. FZ Rossendorf, Postfach 510119, D-01314 Dresden (Germany)
  • 3. Vacuumschmelze GmbH and Co. KG, Postfach 2253, D-63412 Hanau (Germany)

Description

The oxygen concentration in Nd-Fe-B alloy was determined with secondary ion mass spectrometry (SIMS) using Cs+-ions. The SIMS measurements were calibrated with oxygen-implanted single crystals. The depth profile of Nd2Fe14B single crystals displays a 0.5 μm thick surface layer with elevated oxygen concentration which can be distinguished from the matrix with an oxygen content c O=0.006±0.002 at%. Polycrystalline samples can exceed this value by far and are sensitive to processing parameters and sample handling. SIMS measurements revealed the oxygen content of the Nd2Fe14B phase considerably lower than the total oxygen content of Nd-Fe-B samples

Additional details

Identifiers

DOI
10.1016/j.jmmm.2004.11.412;
PII
S0304-8853(04)01714-7;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
290-291
Journal Page Range
p. 1240-1242
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
Joint European magnetic symposia
Acronym
JEMS '04
Dates
5-10 Sep 2004
Place
Dresden (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37026795
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BORON ALLOYS; CESIUM IONS; DEPTH; IMPURITIES; ION MICROPROBE ANALYSIS; IRON ALLOYS; LAYERS; MASS SPECTROSCOPY; MONOCRYSTALS; NEODYMIUM ALLOYS; OXYGEN; PERMANENT MAGNETS; POLYCRYSTALS; SURFACES
Descriptors DEC
ALLOYS; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTALS; DIMENSIONS; ELEMENTS; EQUIPMENT; IONS; MAGNETS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NONMETALS; RARE EARTH ALLOYS; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.