Published 1986 | Version v1
Book

SPRED spectrograph upgrade

  • 1. Princeton Univ., NJ (USA)

Description

This paper discusses two improvements to the SPRED mutichannel EUV spectrographs used on TFTR and PBX; A new 2100 g/mm grating covering the 100-320 angstrom 0 region with 0.4 angstrom resolution (FWHM) has been added to the existing 450 g/mm grating (100-1100 angstrom with 2.0 angstrom resolution), and the TFTR SPRED has been absolutely calibrated using synchrotron radiation from the NBS SURF II facility and branching ratio measurements; the PBX system has been calibrated using branching ratios and line ratios from charge exchange recombination excited lines. The availability of high resolution spectra in the 100-320 angstrom range allows more reliable measurements of metallic ion emissions and, when the instrument views across a neutral beam as in PBX, provides a complete spectroscopic inventory of both low- and high-Z impurities in a single discharge

Additional details

Additional titles

Subtitle (English)
High resolution grating and improved absolute calibration

Publishing Information

Publisher
Princeton Plasma Physics Laboratory.
Imprint Place
Princeton, NJ (USA)
Imprint Title
Proceedings of the 6th topical conference on high temperature plasma diagnostics
Imprint Pagination
92 p.
Journal Page Range
p. J15.

Conference

Title
6. topical conference on high temperature plasma diagnostics.
Dates
9-13 Mar 1986.
Place
Hilton Head Island, SC (USA).

Optional Information

Secondary number(s)
CONF-860324--.