Published August 14, 2006 | Version v1
Journal article

Post-growth engineering of InAs/GaAs quantum dots' band-gap using proton implantation and annealing

  • 1. Laboratoire de Physique des Semiconducteurs et des Composants Electroniques, Faculte des Sciences, Avenue de l'environnement, 5019 Monastir (Tunisia)
  • 2. Centre de Recherche en Nanofabrication et Nanocaracterisation (CRN2), Universite de Sherbrooke (Quebec) (Canada)

Description

Proton implantation followed by rapid thermal annealing (RTA) has been employed for the post-growth tuning of the band gap of molecular beam epitaxy grown InAs/GaAs quantum dots (QDs). To enhance QD intermixing, point defects are created by proton implantation at different doses (5 x 1010-1014 cm-2) followed by rapid thermal annealing at 675 deg. C for 30 s. Low-temperature photoluminescence (PL) measurements have shown that the proton-implantation-induced intermixing alters both the optical transition energies and the PL full width at half maximum (FWHM). A purely proton-implantation induced band gap tuning limit of 131 meV has been achieved for an implantation dose of 5 x 1013 cm-2, keeping both the QDs' character and around 46% of the initial integrated PL intensity

Availability note (English)

Available online at http://stacks.iop.org/0957-4484/17/3707/nano6_15_015.pdf or at the Web site for the journal Nanotechnology (Print) (ISSN 1361-6528 ) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
17
Journal Issue
15
Journal Page Range
p. 3707-3709
ISSN
0957-4484