Published September 2009 | Version v1
Journal article

Non-destructive testing of polycrystalline diamond cutters using dc electrical conductivity imaging

  • 1. Metal Processing Institute and Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, 100 Institute Rd, Worcester, MA 01609 (United States)
  • 2. US Synthetic, 1260 South 1600 West, Orem, UT 84058 (United States)

Description

A new application of electrical impedance tomography/resistivity imaging is investigated: non-destructive testing of polycrystalline diamond cutters used for rock drilling. An instrument employing 121 spring-loaded probes to contact the diamond surface of a cutter was constructed. The acquired 4-probe dc resistance data are reconstructed using an established algorithm into a 3D electrical conductivity distribution within the diamond table. Measurements on cutter samples demonstrate the feasibility and potential utility of this imaging method. Flaws, such as metal rich zones, can be detected. The bulk conductivity is also found to be a strong function of manufacturing process parameters

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/20/9/095707

Additional details

Identifiers

DOI
10.1088/0957-0233/20/9/095707;
PII
S0957-0233(09)17834-7;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
20
Journal Issue
9
Journal Page Range
[10 p.]
ISSN
0957-0233
CODEN
MSTCEP