Electric field dependent positronium formation in α-SiO2
Creators
- 1. National Inst. of Materials and Chemical Research, Tsukuba, Ibaraki (Japan)
- 2. Dept. of Chemistry, Tokyo Inst. of Tech. (Japan)
Description
We measured ortho-positronium (o-Ps) formation probability, I3, in amorphous SiO2 as a function of external electric field up to 100 kV/cm. It was found that I3 decreases from 53.9% at F = 0 to 48.7% at F = 100 kV/cm. In spite of the strong electric field effect on the Ps yield, the positron mobility, determined by the positron annihilation Doppler broadening technique, was 0±2 cm2/s.V in this material. Therefore, α-SiO2 is the first ever studied bulk solid material with low positron mobility, exhibiting strong electric field effect on Ps formation. The field dependent Ps formation in α-SiO2 is associated with the high mobility of excess electrons but not that of the positron as in the case of nonpolar polymers such as polyethylene. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 363-365
- Journal Page Range
- p. 138-140
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- 12. international conference on positron annihilation
- Acronym
- ICPA-12
- Dates
- 6-12 Aug 2000
- Place
- Munich (Germany)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 32031061
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; ANNIHILATION; DOPPLER BROADENING; ELECTRIC FIELDS; MOBILITY; POSITRONIUM; POSITRONS; SILICON OXIDES
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; CHALCOGENIDES; ELEMENTARY PARTICLES; FERMIONS; INTERACTIONS; LEPTONS; LINE BROADENING; MATTER; OXIDES; OXYGEN COMPOUNDS; PARTICLE INTERACTIONS; SILICON COMPOUNDS
Optional Information
- Notes
- 16 refs.