An Introduction to Differential EXAFS

Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale that result from the modulation of a given sample property. Experiments conducted to date have revealed a sensitivity to such perturbations of the order of femtometres, two orders of magnitude more sensitive than is considered possible by conventional EXAFS techniques. Here, the concept behind DiffEXAFS is described, and experimental factors required to detect such a signal discussed