Experimental investigation of effect on hot electron produced by various wavelength laser
- 1. China Institute of Atomic Energy, Beijing (China)
Description
The interactions of two kinds of wavelength ultra-short pulse (744 nm/120 fs/12 mJ, 248 nm/420 fs/35 mJ) laser with solid (Cu) plasma targets were experimentally investigated, and the hot electron spectra and angular distribution were measured by electron magnetic spectrometer and imaging plate (IP) detectors in laser incident plane. At the conditions of pre-pulse free and P polarization and 45° incidence, the temperatures of hot electron fitted by Maxwellian are 46 and 19.4 keV, respectively, and the hot electrons are emit ted mainly along the normal direction of targets. The dominant mechanisms of hot electron generating are vacuum heating (VH). It is experimentally validated that the scaling law of VH is Th ≈ 4.11 × 10-2 (Iλ2)1/2.54 (keV). The charge separation potential of plasma are about 70 and 45 keV, respectively. (authors)
Additional details
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 42
- Journal Issue
- suppl
- Journal Page Range
- p. 349-353
- ISSN
- 1000-6931
Conference
- Title
- 5. Symposium on Nuclear Technology Application of Beijing Nuclear Society
- Dates
- 2008
- Place
- Beijing (China)
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 47094088
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; COPPER; ELECTRON SPECTRA; EMISSION; HEATING; INCIDENCE ANGLE; IONS; KEV RANGE 10-100; LASERS; MAGNETIC SPECTROMETERS; PLASMA; POLARIZATION; PULSES; SCALING LAWS; TAIL ELECTRONS; WAVELENGTHS
- Descriptors DEC
- CHARGED PARTICLES; DISTRIBUTION; ELECTRONS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; KEV RANGE; LEPTONS; MEASURING INSTRUMENTS; METALS; SPECTRA; SPECTROMETERS; TRANSITION ELEMENTS
Optional Information
- Notes
- 8 figs., 11 refs.