Characterizations of MgO substrates and epitaxial YBCO thin films
Creators
- 1. Commonwealth Scientific and Industrial Organisation, Lindfield, NSW (Australia)
Description
Full text: YBCO films were grown on MgO substrates for fabricating step-edge junction SQUIDs and other devices. In-plane 45' grain misalignment was frequently observed in the films grown on the degraded or contaminated MgO substrates. We investigated the chemical properties of the MgO substrates of varied surface conditions that are due to different substrate preparation methods and environmental degradation by using XPS. The in-plane grain orientation of the YBCO films was studied by means of XRD phi-scan. A final cleaning step of MgO substrates using an ion beam etching (IBE) prior to the thin film deposition was found to be effective in removing the in-plane grain misalignment and promoting the growth of perfectly aligned c-axis YBCO films. Copyright (2005) Australian Institute of Physics
Additional details
Identifiers
Publishing Information
- Imprint Title
- 16th National Congress of the Australian Institute of Physics. Congress Proceedings Handbook and Abstracts
- Imprint Pagination
- 268 p.
- Journal Page Range
- p. 171
Conference
- Title
- 16. National Congress of the Australian Institute of Physics. Physics for the Nation
- Dates
- 30 Jan - 4 Feb 2005
- Place
- Canberra, ACT (Australia)
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37101730
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BARIUM COMPOUNDS; CHEMICAL PROPERTIES; CUPRATES; EPITAXY; ETCHING; GRAIN ORIENTATION; HIGH-TC SUPERCONDUCTORS; ION BEAMS; MAGNESIUM OXIDES; SQUID DEVICES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BEAMS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; MAGNESIUM COMPOUNDS; MEASURING INSTRUMENTS; MICROSTRUCTURE; MICROWAVE EQUIPMENT; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; SUPERCONDUCTING DEVICES; SUPERCONDUCTORS; SURFACE FINISHING; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS