Influence of substrate and its temperature on the optical constants of CuIn1−xGaxSe2 thin films
Creators
- 1. Helmholtz-Zentrum Berlin für Materialien und Energie, Nanooptical Concepts for PV, Hahn-Meitner-Platz 1, 14109 Berlin (Germany)
Description
We investigate the influence of substrate and its temperature on the optical constants of CuIn1−xGaxSe2 (CIGSe) thin films using the transfer-matrix method. The optical constants of a CIGSe layer on top of a transparent conducting oxide (TCO) layer were calculated considering the realistic optical constants of the TCO layer after CIGSe deposition. It was found that TCO substrates could influence the optical constants of CIGSe layers and that the ITO (Sn doped In2O3) substrate had a greater impact than IMO (Mo doped In2O3) for the CIGSe (x = 0.4) film when compared to a reference on bare glass substrate. Additionally, the varied substrate temperatures did not impact the optical constants of CGSe (x = 1). For CIGSe (x = 0.4), the refractive index n stayed relatively independent although at low temperature the grain size was reduced and the Ga/(Ga+In) profile was altered compared to that at high temperature (610 °C). In contrast, the extinction coefficient k at low temperature showed higher absorption at longer wavelengths because of a lower minimum bandgap (Eg,min) originating from reduced inter-diffusion of Ga–Se at a low substrate temperature. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/47/13/135101Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 47
- Journal Issue
- 13
- Journal Page Range
- [6 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46039196
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- DEPOSITION; DOPED MATERIALS; GLASS; GRAIN SIZE; INDIUM OXIDES; MOLYBDENUM; REFRACTIVE INDEX; SUBSTRATES; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; TIN; TRANSFER MATRIX METHOD; WAVELENGTHS
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; ELEMENTS; FILMS; INDIUM COMPOUNDS; MATERIALS; METALS; MICROSTRUCTURE; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METALS; SIZE; TEMPERATURE RANGE; TRANSITION ELEMENTS