Published 1986
| Version v1
Book
Quantitative x-ray analysis
Description
The various approaches to quantification of x-ray data in analytical electron microscopy are developed. Criteria for the application of absorption and flourescence corrections are also given. In addition to quantification techniques, statistical methods for determining analytical errors and minimum detectability limits are developed for the user. Aproaches to defining and measuring x-ray spatial resolution are discussed and several examples illustrating the use of the quantification techniques and the x-ray statistical methods are given
Additional details
Publishing Information
- Publisher
- Plenum Press.
- Imprint Place
- New York, NY (USA)
- Imprint Title
- Principles of analytical electron microscopy
- Journal Page Range
- p. 155-218.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18054879
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CALIBRATION STANDARDS; COMPILED DATA; CORRECTIONS; CROSS SECTIONS; EFFICIENCY; ELECTRON BEAM TARGETS; ELECTRON MICROSCOPY; ELEMENTS; ENERGY DEPOSITION; INNER-SHELL IONIZATION; INTERMETALLIC COMPOUNDS; LINE BROADENING; LINE WIDTHS; SEMICONDUCTOR MATERIALS; SPATIAL RESOLUTION; THIN FILMS; X-RAY FLUORESCENCE ANALYSIS; X-RAY FLUORESCENCE ANALYZERS
- Descriptors DEC
- ALLOYS; CHEMICAL ANALYSIS; DATA; FILMS; INFORMATION; IONIZATION; MATERIALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; RESOLUTION; TARGETS; X-RAY EMISSION ANALYSIS