Published June 24, 2015 | Version v1
Journal article

Effect of Te addition into As2Se3 thin film: Optical property study by FTIR and XPS

  • 1. Department of Physics, Utkal University, Bhubaneswar-751004, Odisha (India)
  • 2. Department of Physics, Indian Institute of Science, Bangalore-560012 (India)

Description

In the present work, we report the effect of Te deposition onto As2Se3 film which affects the optical properties. The Te/As2Se3 film was illuminated with 532 nm laser to study the photo induced diffusion. The prepared As2Se3, Te/As2Se3 films were characterized by X-ray diffraction which show a completely amorphous nature. On the basis of optical transmission data carried out by Fourier Transform infrared Spectroscopy, a non direct transition was found for these films. The optical bandgap is found to be decreased with Te deposition and photo darkening phenomena is observed for the diffused film. The change in the optical constants are also supported by the corresponding change in different types of bonds which are being analyzed by X-ray photoelectron spectroscopy

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1665
Journal Issue
1
Journal Page Range
vp.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
59. DAE solid state physics symposium 2014
Dates
16-20 Dec 2014
Place
Tamilnadu (India)

Optional Information

Notes
(c) 2015 AIP Publishing LLC