Published April 2012 | Version v1
Journal article

Development of a novel 2D position-sensitive semiconductor detector concept

  • 1. Centro Nacional de Microelectrónica (IMB-CNM-CSIC), Campus Univ. Autónoma de Barcelona 08193 Bellaterra, Barcelona (Spain)
  • 2. Instituto de Física de Cantabria IFCA (CSIC-UC), Edificio Juan Jordá, Avenida de los Castros, s/n, E-39005 Santander (Spain)

Description

A novel 2D position-sensitive semiconductor detector concept has been developed employing resistive electrodes in a single-sided silicon microstrip sensor. The resistive charge division method has been implemented reading out each strip at both ends, in order to get the second coordinate of an ionizing event along the strips length. Two generations of prototypes, with different layout, have been produced and characterized using a pulsed near infra-red laser. The feasibility of the resistive charge division method in silicon microstrip detectors has been demonstrated and the possibility of single-chip readout of the device has been investigated. Experimental data were compared with the theoretical expectations and the electrical simulation of the sensor equivalent circuit coupled to simple electronics readout circuits. The agreement between experimental and simulation results validates the developed simulation as a tool for the optimization of future sensor prototypes.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/7/04/C04008

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
7
Journal Issue
04
Journal Page Range
p. C04008
ISSN
1748-0221

Conference

Title
9. international conference on position sensitive detectors
Acronym
PSD9
Dates
12-16 Sep 2011
Place
Aberystwyth (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44051265
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COORDINATES; ELECTRODES; EQUIVALENT CIRCUITS; OPTIMIZATION; READOUT SYSTEMS; SENSORS; SI MICROSTRIP DETECTORS; SIMULATION
Descriptors DEC
ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS