Published January 2007 | Version v1
Journal article

Spatial characterisation of the orientation distributions in a stable plane strain-compressed Cu crystal: A statistical analysis

  • 1. Eoetvoes University, Institute of Physics, Pazmany Peter setany 1/A, 1117-Budapest (Hungary)
  • 2. Microstructures and Processing Department, Ecole des Mines de St Etienne, CNRS Federation 2145 and UMR 5146 (France)

Description

Single copper crystals of the stable Goss orientation {0 1 1}<1 0 0> were deformed in plane strain compression and the deformation-induced dislocation structures were investigated by high-resolution electron backscattered diffraction. Although the orientation maps exhibited an anisotropic dislocation boundary structure it was shown that the mean disorientation angle between point pairs saturated and became isotropic if their spacing was large enough (typically >30 μm). This saturation behaviour was interpreted as being a consequence of the anti-correlations between nearby dislocation boundaries and is discussed in terms of recent stochastic models of boundary formation. It was found that the disorientation boundaries, which were considered as being formed at relatively low strains, underwent rigid body-like rotations during deformation

Additional details

Identifiers

DOI
10.1016/j.actamat.2006.08.043;
PII
S1359-6454(06)00620-3;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
55
Journal Issue
2
Journal Page Range
p. 487-496
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38037841
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANISOTROPY; COMPRESSION; COPPER; DEFORMATION; DISLOCATIONS; ELECTRON DIFFRACTION; MICROSTRUCTURE; STRAINS
Descriptors DEC
COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; LINE DEFECTS; METALS; SCATTERING; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.