Spatial characterisation of the orientation distributions in a stable plane strain-compressed Cu crystal: A statistical analysis
Creators
- 1. Eoetvoes University, Institute of Physics, Pazmany Peter setany 1/A, 1117-Budapest (Hungary)
- 2. Microstructures and Processing Department, Ecole des Mines de St Etienne, CNRS Federation 2145 and UMR 5146 (France)
Description
Single copper crystals of the stable Goss orientation {0 1 1}<1 0 0> were deformed in plane strain compression and the deformation-induced dislocation structures were investigated by high-resolution electron backscattered diffraction. Although the orientation maps exhibited an anisotropic dislocation boundary structure it was shown that the mean disorientation angle between point pairs saturated and became isotropic if their spacing was large enough (typically >30 μm). This saturation behaviour was interpreted as being a consequence of the anti-correlations between nearby dislocation boundaries and is discussed in terms of recent stochastic models of boundary formation. It was found that the disorientation boundaries, which were considered as being formed at relatively low strains, underwent rigid body-like rotations during deformation
Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2006.08.043;
- PII
- S1359-6454(06)00620-3;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 55
- Journal Issue
- 2
- Journal Page Range
- p. 487-496
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38037841
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; COMPRESSION; COPPER; DEFORMATION; DISLOCATIONS; ELECTRON DIFFRACTION; MICROSTRUCTURE; STRAINS
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; LINE DEFECTS; METALS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.