Published June 2013 | Version v1
Journal article

Nanodot deposition and its application with atomic force microscope

  • 1. Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China)
  • 2. Shenyang Jianzhu University (China)
  • 3. Chiba Institute of Technology (Japan)

Description

Nanodot deposition using atomic force microscope (AFM) is investigated. To realize repeatable and precise deposition of nanodots, the detailed control method is discussed. The electric field between AFM tip and substrate is analyzed, and a convenient method to control tip–substrate separation is proposed. In experiments, two nanodot matrixes are fabricated and the heights of the nanodots are analyzed. Experimental results testify that the control method can lead to repeatable and precise fabrication of deposited nanodots. As an application of deposited nanodots, a carbon nanotube (CNT) is soldered on gold electrodes with deposited Au nanodots. After soldering, the contact resistances between the CNT and the electrodes decrease greatly. AFM-based nanodot deposition can be used to fabricate special nanopatterns; also it can be used to solder nanomaterials on substrates to improve the electrical connection, which has a promising future for nanodevice fabrication.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Nanoparticle Research
Journal Volume
15
Journal Issue
6
Journal Page Range
p. 1-11
ISSN
1388-0764

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44070189
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; DEPOSITION; GOLD; QUANTUM DOTS; SOLDERING
Descriptors DEC
CARBON; ELEMENTS; FABRICATION; JOINING; METALS; MICROSCOPY; NANOSTRUCTURES; NANOTUBES; NONMETALS; TRANSITION ELEMENTS; WELDING

Optional Information

Copyright
Copyright (c) 2013 Springer Science+Business Media Dordrecht