Published July 1, 2016 | Version v1
Journal article

Screening mechanisms at polar oxide heterointerfaces

  • 1. Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States)
  • 2. Department of Materials Science and Engineering and Institute of Material Science, University of Connecticut, Storrs, CT 06269 (United States)

Description

The interfaces of polar oxide heterostructures can display electronic properties unique from the oxides they border, as they require screening from either internal or external sources of charge. The screening mechanism depends on a variety of factors, including the band structure at the interface, the presence of point defects or adsorbates, whether or not the oxide is ferroelectric, and whether or not an external field is applied. In this review, we discuss both theoretical and experimental aspects of different screening mechanisms, giving special emphasis to ways in which the mechanism can be altered to provide novel or tunable functionalities. We begin with a theoretical introduction to the problem and highlight recent progress in understanding the impact of point defects on polar interfaces. Different case studies are then discussed, for both the high thickness regime, where interfaces must be screened and each interface can be considered separately, and the low thickness regime, where the degree and nature of screening can be manipulated and the interfaces are close enough to interact. We end with a brief outlook toward new developments in this rapidly progressing field. (review)

Availability note (English)

Available from http://dx.doi.org/10.1088/0034-4885/79/7/076501

Additional details

Publishing Information

Journal Title
Reports on Progress in Physics
Journal Volume
79
Journal Issue
7
Journal Page Range
[40 p.]
ISSN
0034-4885
CODEN
RPPHAG

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49075136
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
FERROELECTRIC MATERIALS; OXIDES; POINT DEFECTS
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; MATERIALS; OXYGEN COMPOUNDS