Published March 2008 | Version v1
Journal article

The growth of Au/Pd on alumina/Cu-Al system

  • 1. Charles University, Faculty of Mathematics and Physics, V Holesovickach 2, 18000 Prague 8 (Czech Republic)
  • 2. Sincrotrone Elettra, Strada Statale 14, km 163.5, 34012 Basovizza-Trieste (Italy)

Description

We have studied thin layered Au/Pd/alumina/Cu-Al system by means of synchrotron radiation photoelectron spectroscopy (SRPES), X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED). Ordered 0.8 nm thick alumina film was prepared by the controlled oxidation of the single-crystalline Cu-9at.%Al(111) support. The Pd and Au layers were prepared afterwards by a step-by-step deposition at room temperature. LEED measurement itself did not confirm epitaxial growth of the metal overlayers. They exhibited a pseudo layer-by-layer growth mode confirmed by work function measurements and the Monte Carlo simulation of the copper XPS peaks attenuation

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/100/1/012040

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
100
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
17. international vacuum congress; ICSS-13: 13. international conference on surface science; ICN+T 2007: International conference on nanoscience and technology
Acronym
IVC-17
Dates
2-6 Jul 2007
Place
Stockholm (Sweden)