Published July 30, 2016 | Version v1
Journal article

Picosecond dynamics of photoexcited carriers in interacting silicon nanocrystals

  • 1. Department of Chemical Physics and Optics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 3, 121 16 Prague 2 (Czech Republic)
  • 2. Department of Nanotechnology, IMTEK, Faculty of Engineering, Albert-Ludwigs-University Freiburg, Georges-Köhler-Allee 103, 79110 Freiburg (Germany)
  • 3. Institute of Nanotechnology & Karlsruhe Nano Micro Facility, Karlruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany)

Description

Highlights: • A unique set of well-defined size-controlled Si nanocrystals separated by SiO2 barriers of different thickness was prepared by a so called superlattices approach. • The picosecond carrier recombination rate was measured directly by femtosecond pump and probe technique. • The effect of inter-nanocrystal separation on the charge carrier recombination was measured and discussed. • The Auger type recombination rate was found to be an exponentially decreasing function of the barrier thickness. - Abstract: The non-radiative Auger carrier recombination plays an important role in physics and the application of semiconductor nanocrystals. Here we report on the effect of inter-nanocrystal carrier interaction on Auger recombination. We prepared a special set of samples containing silicon nanocrystals embedded in silicon oxide with well-defined geometry. The picosecond carrier recombination rate measured by femtosecond pump and probe technique was found to be strongly dependent on the inter-nanocrystal separation. The observed decrease of the decay rate with nanocrystal separation on the nanometer scale is interpreted in terms of the wave function overlap appearing in the relevant matrix element describing the recombination process.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2016.03.121

Additional details

Identifiers

DOI
10.1016/j.apsusc.2016.03.121;
PII
S0169-4332(16)30577-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
377
Journal Page Range
p. 238-243
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.