Picosecond dynamics of photoexcited carriers in interacting silicon nanocrystals
Creators
- 1. Department of Chemical Physics and Optics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 3, 121 16 Prague 2 (Czech Republic)
- 2. Department of Nanotechnology, IMTEK, Faculty of Engineering, Albert-Ludwigs-University Freiburg, Georges-Köhler-Allee 103, 79110 Freiburg (Germany)
- 3. Institute of Nanotechnology & Karlsruhe Nano Micro Facility, Karlruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany)
Description
Highlights: • A unique set of well-defined size-controlled Si nanocrystals separated by SiO2 barriers of different thickness was prepared by a so called superlattices approach. • The picosecond carrier recombination rate was measured directly by femtosecond pump and probe technique. • The effect of inter-nanocrystal separation on the charge carrier recombination was measured and discussed. • The Auger type recombination rate was found to be an exponentially decreasing function of the barrier thickness. - Abstract: The non-radiative Auger carrier recombination plays an important role in physics and the application of semiconductor nanocrystals. Here we report on the effect of inter-nanocrystal carrier interaction on Auger recombination. We prepared a special set of samples containing silicon nanocrystals embedded in silicon oxide with well-defined geometry. The picosecond carrier recombination rate measured by femtosecond pump and probe technique was found to be strongly dependent on the inter-nanocrystal separation. The observed decrease of the decay rate with nanocrystal separation on the nanometer scale is interpreted in terms of the wave function overlap appearing in the relevant matrix element describing the recombination process.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2016.03.121Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2016.03.121;
- PII
- S0169-4332(16)30577-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 377
- Journal Page Range
- p. 238-243
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48021362
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; CARRIERS; CHARGE CARRIERS; DECAY; GEOMETRY; MATRIX ELEMENTS; NANOSTRUCTURES; PROBES; PUMPS; RECOMBINATION; SEMICONDUCTOR MATERIALS; SILICA; SILICON; SILICON OXIDES; SUPERLATTICES; THICKNESS; WAVE FUNCTIONS
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONS; ELEMENTS; EQUIPMENT; FUNCTIONS; MATERIALS; MATHEMATICS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.