Published 1996 | Version v1
Book

A portable high resolution Compton backscatter scanning instrument

  • 1. Lambeau High Sci. and Tech. Enterprise Group Ltd. Liability Co., Suzhou (China)

Description

Model LBD101 Compton Backscatter Scanning Instrument is developed and manufactured by LAMBEAU for industrial field NDT and NDE and security inspection from one side of the object being inspected. The novel instrument uses a very simple and compact one-source and one-detector system geometry. The superior specifications of the LBD101 includes: the best spatial resolution of better than 0.8 mm, the best density resolution of about 1%, the minimum detectable defect volume of less than 0.6 mm3, the minimum defect size of less than Θ0.8 mm, the minimum crack width of less than 0.15 mm. It has the high safety of radiation protection and very low radiation dose rate. Several main technical problems to design a portable high resolution Compton backscatter scanning instrument are given in the paper. It gives also some results in practical testing. (author)

Part of:
Trends in NDE science and technology: proceedings of the fourteenth world conference on NDT. V. 2

Additional details

Publishing Information

Publisher
Oxford and IBH Publishing Co. Pvt. Ltd.
Imprint Place
New Delhi (India)
ISBN
81-204-1124-6; 81-204-1124-2
Imprint Title
Trends in NDE science and technology: proceedings of the fourteenth world conference on NDT. V. 2
Imprint Pagination
[974 p.]
Journal Page Range
p. 353-356

Conference

Title
14. world conference on NDT
Acronym
WCNDT
Dates
8-13 Dec 1996
Place
New Delhi (India)

Optional Information