A portable high resolution Compton backscatter scanning instrument
Creators
- 1. Lambeau High Sci. and Tech. Enterprise Group Ltd. Liability Co., Suzhou (China)
Description
Model LBD101 Compton Backscatter Scanning Instrument is developed and manufactured by LAMBEAU for industrial field NDT and NDE and security inspection from one side of the object being inspected. The novel instrument uses a very simple and compact one-source and one-detector system geometry. The superior specifications of the LBD101 includes: the best spatial resolution of better than 0.8 mm, the best density resolution of about 1%, the minimum detectable defect volume of less than 0.6 mm3, the minimum defect size of less than Θ0.8 mm, the minimum crack width of less than 0.15 mm. It has the high safety of radiation protection and very low radiation dose rate. Several main technical problems to design a portable high resolution Compton backscatter scanning instrument are given in the paper. It gives also some results in practical testing. (author)
Additional details
Publishing Information
- Publisher
- Oxford and IBH Publishing Co. Pvt. Ltd.
- Imprint Place
- New Delhi (India)
- ISBN
- 81-204-1124-6; 81-204-1124-2
- Imprint Title
- Trends in NDE science and technology: proceedings of the fourteenth world conference on NDT. V. 2
- Imprint Pagination
- [974 p.]
- Journal Page Range
- p. 353-356
Conference
- Title
- 14. world conference on NDT
- Acronym
- WCNDT
- Dates
- 8-13 Dec 1996
- Place
- New Delhi (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 30025108
- Subject category
- S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPTON EFFECT; COMPTON SCATTERING TOMOGRAPHY; CRACKS; DATA ACQUISITION SYSTEMS; ENERGY SPECTRA; INSPECTION; NONDESTRUCTIVE TESTING; NUCLEAR INDUSTRY; PHOTONS; RADIATION PROTECTION; SPECIFICATIONS; X-RAY SOURCES
- Descriptors DEC
- BASIC INTERACTIONS; BOSONS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELEMENTARY PARTICLES; INDUSTRY; INTERACTIONS; MASSLESS PARTICLES; MATERIALS TESTING; RADIATION SOURCES; SCATTERING; SPECTRA; TESTING; TOMOGRAPHY