High dielectric constant in Al-doped ZnO ceramics using high-pressure treated powders
Description
Pure and Al-doped ZnO ceramics were prepared by conventional sintering high pressure treated nano powders at 1150 °C for 2 h, and the effect of Al-doping on the microstructure and dielectric properties were mainly investigated. X-ray diffraction (XRD) and scanning electron microscopy (SEM) results revealed that Al reacted with ZnO and formed ZnAl2O4 nano-precipitates on the grain boundaries. Small amount of ZnAl2O4 nano-precipitates (i.e. < 1 mol%) enhanced the grain growth of ZnO, while larger amount suppressed the grain growth. AC impedance analysis indicated that Al-doping decreases the resistivity of ZnO ceramics. Dielectric studies revealed that the incorporation of Al in ZnO can significantly enhance the dielectric constant (1.39 × 104 at 1 kHz) of ZnO ceramics. And the dielectric behavior can be well-explained by Maxwell–Wagner relaxation. - Highlights: • We firstly synthesized high dielectric constant ZnO ceramics using high pressure treating method. • Dielectric constant as high as 104 was obtained in the 3 mol% Al doped sample. • Porous structure together with dopant contributes to the enhanced dielectric constant.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2015.10.079Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2015.10.079;
- PII
- S0925-8388(15)31334-7;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 657
- Journal Page Range
- p. 90-94
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49099712
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; DIELECTRIC MATERIALS; DOPED MATERIALS; ELECTRON SCANNING; GRAIN BOUNDARIES; GRAIN GROWTH; PERMITTIVITY; POROUS MATERIALS; POWDERS; PRESSURE RANGE MEGA PA 10-100; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PRESSURE RANGE; PRESSURE RANGE MEGA PA; SCATTERING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.