Phase Contrast Imaging in Laboratory
Creators
- 1. AREVA NP - Services sector, 71 - Saint Marcel (France)
- 2. CNDRI, INSA-Lyon, 69 - Villeurbanne (France)
Description
Since Roentgen's discovery of X-rays, just over a century ago, the vast majority of radiographs have been acquired and interpreted on the basis of absorption contrast. The recent development of X-ray phase contrast imaging techniques opens up a new opportunity especially for weakly-absorbing objects. Spatial and temporal coherence of X-ray synchrotron radiation permits to realize phase contrast imaging with ideal conditions. But it is possible to set up phase contrast imaging in laboratory. Laboratory phase contrast imaging can provide new solutions in an industrial context. The aim of this paper is to present the different solutions to perform phase contrast imaging in laboratory: - classical micro focus X-ray tube, - X-ray ultra microscope (XuM) developed by an Australian team - table top synchrotron developed by a Japanese team, - multilayer, - poly-capillary. (authors)
Availability note (English)
Available from INSA-Lyon, Laboratoire CNDRI, Bat Saint Exupery, 69621 - Villeurbanne Cedex (France)Additional details
Publishing Information
- Imprint Pagination
- 9 p.
- Report number
- INIS-FR--08-1099
Conference
- Title
- International symposium on digital industrial radiology and computed tomography
- Acronym
- DIR 2007
- Dates
- 25-27 Jun 2007
- Place
- Lyon (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 39104386
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BEAM OPTICS; BRAGG REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION SOURCES; TOMOGRAPHY; X-RAY RADIOGRAPHY; X-RAY SOURCES; X-RAY TUBES
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; ELECTRON TUBES; EQUIPMENT; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MICROSCOPY; NONDESTRUCTIVE TESTING; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; REFLECTION; TESTING; X-RAY EQUIPMENT
Optional Information
- Notes
- 5 refs.