Published October 1, 2016 | Version v1
Journal article

Finishing technologies for processing of optical microelectronic items

  • 1. Perm National Research Polytechnic University, Komsomolsky prospekt 29, 614990 Perm, Perm krai (Russian Federation)
  • 2. National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, 115409 Moscow (Russian Federation)

Description

This article discusses comparative studies of the influence of specific pressure and speed of relative motion of tool and item on polishing capacity and quality of processed surface of lithium niobate single crystal. The equation for calculation of total depth of layer destroyed upon finishing and time of polishing required for its removal. Analysis of polishing tool has accounted for strength properties of the polishing material, removal capacity, and quality of processed surface of lithium niobate single crystal. It is experimentally established that upon basic pressure both for woven and unwoven polishers with the highest capacity the lower limit of grain coarseness of polishing suspension is 1/0.5 μm. A reserve of increase in shape accuracy and polishing quality is the use of polishers with equal thickness and structure of working surface. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/151/1/012043

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
151
Journal Issue
1
Journal Page Range
[10 p.]
ISSN
1757-899X

Conference

Title
1. international telecommunication conference on advanced micro- and nanoelectronic systems and technologies
Dates
22-23 Dec 2015
Place
Moscow (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49074074
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; CAPACITY; EQUATIONS; LAYERS; LITHIUM; MICROELECTRONICS; MONOCRYSTALS; NIOBATES; POLISHING; PROCESSING; SURFACES; SUSPENSIONS; THICKNESS
Descriptors DEC
ALKALI METALS; CRYSTALS; DIMENSIONS; DISPERSIONS; ELEMENTS; METALS; NIOBIUM COMPOUNDS; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SURFACE FINISHING; TRANSITION ELEMENT COMPOUNDS