Structure and properties of duodenary (TiVCrZrNbMoHfTaWAlSi)N coatings by reactive magnetron sputtering
Creators
- 1. Department of Mechanical Engineering, National Chin-Yi University of Technology, Taichung, 411 (China)
Description
Highlights: • The (TiVCrZrNbMoHfTaWAlSi)N coatings with RN was synthetized • The structural evolution and physical properties with RN was demonstrated • High mixing entropy during lower free entropy of the solid solution phase is evident. • High RN leads to increased metal–N bonds and residual stress. • The hardness of the coatings is enhanced up to 34.8 GPa. The influence of the N2-to-total (N2+Ar) ratio (RN) on the structure and properties of duodenary (TiVCrZrNbMoHfTaWAlSi)N coatings with markedly high mixing entropy is investigated. The coatings are deposited by DC reactive magnetron sputtering with an equimolar TiVCrZrNbMoHfTaWAlSi target. No external bias and heating are applied to the substrate. An increase in RN contributes to an increase in N concentration, residual stress, and lattice parameter. At low RN, the coatings have an amorphous structure. When RN is 15%, an FCC nanocrystal structure with (200)-preferred orientation appears. When RN increases to 20%, HCP nitride nanocrystals coexist with coarse columnar grain FCC structures with (111)-preferred orientation. As RN increases to 50%, the grain size decreases, and their preferred FCC orientation returns to (200). Given that the mechanical and electro-optical properties are strongly correlated with RN, the hardness of the coatings is enhanced up to 34.8 GPa. However, the electrical conductivity and light reflectivity at 0.62 eV deteriorate from 5319 S/cm to 62.1 S/cm and from 71.2% to 42.8%, respectively. These results provide a valuable basis for the future development of high-entropy nitrides.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2018.08.068Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2018.08.068;
- PII
- S0254058418307338;
Publishing Information
- Journal Title
- Materials Chemistry and Physics (Print)
- Journal Volume
- 220
- Journal Page Range
- p. 98-110
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53032456
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CONCENTRATION RATIO; DEPOSITS; ELECTRIC CONDUCTIVITY; ENTROPY; FCC LATTICES; GRAIN ORIENTATION; GRAIN SIZE; HARDNESS; LATTICE PARAMETERS; MAGNETRONS; MIXING; NANOCRYSTALS; NITRIDES; REFLECTIVITY; RESIDUAL STRESSES; SOLID SOLUTIONS; SPUTTERING; SUBSTRATES
- Descriptors DEC
- CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; CUBIC LATTICES; DIMENSIONLESS NUMBERS; DISPERSIONS; ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; HOMOGENEOUS MIXTURES; MECHANICAL PROPERTIES; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MIXTURES; NANOSTRUCTURES; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; ORIENTATION; PHYSICAL PROPERTIES; PNICTIDES; SIZE; SOLUTIONS; STRESSES; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; THREE-DIMENSIONAL LATTICES
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.