Measurement of beam waist for an optical cavity based on Gouy phase
Creators
- 1. Department of Engineering Physics, Tsinghua University, Beijing 100084 (China)
- 2. KEK: High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)
- 3. Department of Accelerator Science, School of High Energy Accelerator Science, Graduate University for Advanced Studies, Shonan International Village, Hayama, Miura, Kanagawa 240-0193 (Japan)
Description
Optical cavities have a variety of applications. However, a highly accurate and efficient method for measuring cavity beam waist size is urgently needed. In this article, we propose a simple approach to deduce the optical cavity beam waist size in terms of Gouy phase using a round-trip matrix for n-mirror cavities. Since Gouy phase can be easily and accurately obtained, this approach provides an alternative way of measuring the beam waist size. Experimentally, the effectiveness of this new method has been demonstrated in a 2-mirror cavity and a 4-mirror planar cavity. The results of beam waist size measurement show fairly good agreement with theoretically predicted values. This method is much simpler, and more convenient than other beam waist size measurement methods, e.g. methods based on pinhole photodiode or CCD.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2012.07.022Additional details
Identifiers
- DOI
- 10.1016/j.nima.2012.07.022;
- PII
- S0168-9002(12)00789-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 694
- Journal Page Range
- p. 6-10
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45023141
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAMS; CAVITIES; CHARGE-COUPLED DEVICES; COMPTON EFFECT; MATRICES; MIRRORS
- Descriptors DEC
- BASIC INTERACTIONS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; INTERACTIONS; SCATTERING; SEMICONDUCTOR DEVICES
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.