A time-of-flight spectrometer for detection of low-energy hydrogen atoms
- 1. FOM Institute for Plasma Physics ''Rijnhuizen,'' Association EURATOM-FOM, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands (Netherlands)
Description
This article deals with an application of the technique of converting hydrogen atoms into negative ions on a low-work-function surface, which is similar to the method nowadays utilized in H- surface sources. This conversion technique is the basis for a time-of-flight spectrometer, for which a proof of principle has recently been established. The conversion takes place on a tungsten (110) crystal target that is covered with cesium. By mounting this target in the detector part of the spectrometer, this apparatus is made sensitive to hydrogen atoms that have energy in the range 10--1000 eV. This feature makes the spectrometer a very powerful and unique tool for detection of low-energy hydrogen atoms. It is, for instance, capable of detecting low-energy hydrogen atoms that are emitted from the edge of a tokamak plasma, and therefore it can yield information on the hydrogen recycling inside the tokamak and hence on the energy balance of the plasma. In the paper we discuss the principle of the detection method, along with a presentation of some time-of-flight spectra that have been obtained from a tokamak plasma
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 61
- Journal Issue
- 1
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 622-624
- ISSN
- 0034-6748
- CODEN
- RSINA
Conference
- Title
- International conference on ion sources.
- Dates
- 10-14 Jul 1989.
- Place
- Berkeley, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21055332
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM-PLASMA SYSTEMS; HYDROGEN IONS; ION SOURCES; NEUTRAL BEAM SOURCES; PLASMA DIAGNOSTICS; SPECIFICATIONS; TIME-OF-FLIGHT SPECTROMETERS; TOKAMAK DEVICES
- Descriptors DEC
- CHARGED PARTICLES; CLOSED PLASMA DEVICES; IONS; MEASURING INSTRUMENTS; SPECTROMETERS; THERMONUCLEAR DEVICES
Optional Information
- Secondary number(s)
- CONF-890703--.