Published January 1990 | Version v1
Journal article

A time-of-flight spectrometer for detection of low-energy hydrogen atoms

  • 1. FOM Institute for Plasma Physics ''Rijnhuizen,'' Association EURATOM-FOM, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands (Netherlands)

Description

This article deals with an application of the technique of converting hydrogen atoms into negative ions on a low-work-function surface, which is similar to the method nowadays utilized in H- surface sources. This conversion technique is the basis for a time-of-flight spectrometer, for which a proof of principle has recently been established. The conversion takes place on a tungsten (110) crystal target that is covered with cesium. By mounting this target in the detector part of the spectrometer, this apparatus is made sensitive to hydrogen atoms that have energy in the range 10--1000 eV. This feature makes the spectrometer a very powerful and unique tool for detection of low-energy hydrogen atoms. It is, for instance, capable of detecting low-energy hydrogen atoms that are emitted from the edge of a tokamak plasma, and therefore it can yield information on the hydrogen recycling inside the tokamak and hence on the energy balance of the plasma. In the paper we discuss the principle of the detection method, along with a presentation of some time-of-flight spectra that have been obtained from a tokamak plasma

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
61
Journal Issue
1
Series
Rev. Sci. Instrum.
Journal Page Range
622-624
ISSN
0034-6748
CODEN
RSINA

Conference

Title
International conference on ion sources.
Dates
10-14 Jul 1989.
Place
Berkeley, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21055332
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM-PLASMA SYSTEMS; HYDROGEN IONS; ION SOURCES; NEUTRAL BEAM SOURCES; PLASMA DIAGNOSTICS; SPECIFICATIONS; TIME-OF-FLIGHT SPECTROMETERS; TOKAMAK DEVICES
Descriptors DEC
CHARGED PARTICLES; CLOSED PLASMA DEVICES; IONS; MEASURING INSTRUMENTS; SPECTROMETERS; THERMONUCLEAR DEVICES

Optional Information

Secondary number(s)
CONF-890703--.