Published October 23, 2008 | Version v1
Journal article Metadata-only

Evolution of Crystallinity and Texturing on 120 MeV Au Ion Irradiation on NiO Thin Films

Creators

  • 1. Department of Physics, North Orissa University, Baripada 757 003 (India)
  • 2. School of Material Science and Technology, IT, BHU, Varanasi 221 005 (India)
  • 3. Inter-University Accelerator Center, Post Box-10502, New Delhi 110 067 (India)
  • 4. Department of Physics, Utkal University, Bhubaneswar 751 004 (India)
  • 5. Department of Physics, National Institute of Technology, Rourkela 769 008 (India)
  • 6. Institute of Physics, Bhubaneswar 751005 (India)

Description

NiO thin films grown on Si(100) substrate by electron beam evaporation and sintered at 500 deg. C and 700 deg. C were irradiated with 120 MeV 197Au9+ ions. The FCC structure of the sintered films was retained up to the highest fluence (3 x l013 ions.cm-2) of irradiation. As against the expected amorphization due to ion irradiation when electronic energy loss exceeds certain threshold value, we observe an improvement of crystallinity and grain orientation at certain fluences of irradiation.

Additional details

Identifiers

DOI
10.1063/1.3027168;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1063
Journal Issue
1
Journal Page Range
p. 256-260
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
International workshop on mesoscopic, nanoscopic and macroscopic materials
Acronym
IWMNMM-2008
Dates
2-4 Jan 2008
Place
Bhubaneswar (India)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41002931
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMORPHOUS STATE; ELECTRON BEAMS; ENERGY LOSSES; EVAPORATION; FCC LATTICES; GOLD IONS; GRAIN ORIENTATION; IRRADIATION; MEV RANGE 100-1000; NANOSTRUCTURES; NICKEL OXIDES; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; THIN FILMS
Descriptors DEC
BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ENERGY RANGE; FILMS; IONS; LEPTON BEAMS; LOSSES; MEV RANGE; MICROSTRUCTURE; NICKEL COMPOUNDS; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHASE TRANSFORMATIONS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS

Optional Information

Notes
(c) 2008 American Institute of Physics