Quantum statistical approach to Debye-Waller factors in EXAFS, EELS and ARXPS IV. Anharmonic contribution in spherical-wave expression
- 1. Chiba Univ. (Japan). Faculty of Science
Description
In this work we have developed a new approach based on Brouder's Lie group formulas to include both spherical wave correction and anharmonic vibration effects, which is not limited to isotropic systems. We apply partial summation technique to get a plane wave part which does not disappear even for large kR limit, and a spherical wave part which disappears for that limit. The former part has just the same cumulants as those used for plane wave EXAFS formulas, however, the latter cannot be reduced to the ordinary cumulants and is closely related to the correction factor due to thermal vibration derived by Rennert within the harmonic approximation. The plane wave part already includes spherical wave effects of photoelectron scattering. Numerical calculations for K-edge EXAFS show that spherical wave thermal factors give rise to different phase from plane wave part, which can give peak shift in Fourier transformed EXAFS spectra. The polarization dependence is also discussed. (author)
Additional details
Publishing Information
- Journal Title
- Journal of the Physical Society of Japan
- Journal Volume
- 64
- Journal Issue
- 6
- Journal Page Range
- p. 2047-2068.
- ISSN
- 0031-9015
- CODEN
- JUPSAU
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 27058784
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- BACKSCATTERING; DEBYE-WALLER FACTOR; FOURIER TRANSFORMATION; QUANTUM MECHANICS; STATISTICAL MECHANICS; TEMPERATURE DEPENDENCE; THEORETICAL DATA; WAVE FORMS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; INFORMATION; INTEGRAL TRANSFORMATIONS; MECHANICS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; SCATTERING; SPECTROSCOPY; TRANSFORMATIONS; X-RAY EMISSION ANALYSIS