Published March 18, 2016 | Version v1
Journal article

A new expression of Ns versus Ef to an accurate control charge model for AlGaAs/GaAs

  • 1. Laboratory of renewable energy devices modeling and nanoscale- MODERNA- University of Constantine 1 (Algeria)

Description

Semi-conductor components become the privileged support of information and communication, particularly appreciation to the development of the internet. Today, MOS transistors on silicon dominate largely the semi-conductors market, however the diminution of transistors grid length is not enough to enhance the performances and respect Moore law. Particularly, for broadband telecommunications systems, where faster components are required. For this reason, alternative structures proposed like hetero structures IV-IV or III-V [1] have been.The most effective components in this area (High Electron Mobility Transistor: HEMT) on IIIV substrate. This work investigates an approach for contributing to the development of a numerical model based on physical and numerical modelling of the potential at heterostructure in AlGaAs/GaAs interface. We have developed calculation using projective methods allowed the Hamiltonian integration using Green functions in Schrodinger equation, for a rigorous resolution "self coherent" with Poisson equation. A simple analytical approach for charge-control in quantum well region of an AlGaAs/GaAs HEMT structure was presented. A charge-control equation, accounting for a variable average distance of the 2-DEG from the interface was introduced. Our approach which have aim to obtain ns-Vg characteristics is mainly based on: A new linear expression of Fermi-level variation with two-dimensional electron gas density in high electron mobility and also is mainly based on the notion of effective doping and a new expression of AEc (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/108/1/012045

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
108
Journal Issue
1
Journal Page Range
[8 p.]
ISSN
1757-899X

Conference

Title
5. international conference on materials and applications for sensors and transducers
Acronym
IC-MAST2015
Dates
27-30 Sep 2015
Place
Mykonos (Greece)