Published 2017
| Version v1
Book
Structural study of Gd/Co multilayer on annealing
Creators
- 1. Solid Sate Physics Division, Bhabha Atomic Research Centre, Mumbai-400085 (India)
- 2. Technical Physics Division, Bhabha Atomic Research Centre, Mumbai-400085 (India)
- 3. UGC DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452017 (India)
Description
High quality Gd/Co multilayer was grown on Si substrate using sputtering technique. X-ray scattering technique was used to characterize the structural properties of the multilayer as a function of annealing temperature. Here we present evolution of structural properties, both atomic and depth dependent, on annealing the Gd/Co multilayer. (author)
Additional details
Publishing Information
- Publisher
- CSIR-National Physical Laboratory
- Imprint Place
- New Delhi (India)
- Imprint Title
- Proceedings of the seventeenth international conference on thin films: abstracts
- Imprint Pagination
- 236 p.
- Journal Page Range
- p. 105
Conference
- Title
- 17. international conference on thin films
- Acronym
- ICTF-2017
- Dates
- 13-17 Nov 2017
- Place
- New Delhi (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 52048077
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; COBALT; CRYSTAL GROWTH; CRYSTALLIZATION; GADOLINIUM; LAYERS; RECRYSTALLIZATION; SUBSTRATES; THIN FILMS
- Descriptors DEC
- ELEMENTS; FILMS; HEAT TREATMENTS; METALS; PHASE TRANSFORMATIONS; RARE EARTHS; TRANSITION ELEMENTS