Published December 2011 | Version v1
Journal article

Photoresponse Properties of an n-ZnS/p-Si Heterojunction

  • 1. School of Materials Science and Engineering, Shanghai University, Shanghai 200072 (China)

Description

An n-ZnS/p-Si heterojunction was fabricated by using the rf magnetron sputtering method. The band gap of the ZnS film is about 3.63 eV. Current-voltage (I—V) characteristics of the ZnS/Si heterojunction are examined and the results show the distinct rectifying characteristics with a turn-on voltage of about 1.8V. The UV (330 nm) and visible (450 nm) photoresponse properties of the heterojunction are also investigated, which demonstrates the potential of such an n-ZnS/p-Si heterojunction for detecting both UV and visible light. (condensed matter: electronic structure, electrical, magnetic, and optical properties)

Availability note (English)

Available from http://dx.doi.org/10.1088/0256-307X/28/12/127301

Additional details

Publishing Information

Journal Title
Chinese Physics Letters
Journal Volume
28
Journal Issue
12
Journal Page Range
[3 p.]
ISSN
0256-307X
CODEN
CPLEEU