Analysis of iron gall inks by PIXE
Creators
- 1. Jozef Stefan Institute, Jamova 39, p.p. 3000, SI-1001 Ljubljana (Slovenia)
- 2. National University Library, Turjaska 1, SI-1000 Ljubljana (Slovenia)
- 3. University of Ljubljana, Faculty of Chemistry and Chemical Technology, Askerceva 5, SI-1000 Ljubljana (Slovenia)
Description
Micro- or non-destructive analytical approach is an imperative when analysing historical artefacts. Due to its practically non-destructive character, proton induced X-ray spectrometry (PIXE) has become a method of choice for the study of historical documents. In the present paper, use of in-air PIXE method for analysis of iron gall inks applied at handwriting of documents is evaluated. The errors arising from the non-uniform ink deposit, proton penetration depth and size of the proton beam versus width of ink lines, effects of surface roughness, as well as the importance of the PIXE set-up geometry on the accuracy of the results are discussed. It follows that the main problems can be attributed to the fact that PIXE is a surface technique and that the analysis is limited to a small amount of material, while ink deposit on the paper is usually non-uniform in depth as well as on the paper surface. Despite possible systematic uncertainties when applying the PIXE method, good correlation between determinations obtained by PIXE and atomic absorption spectroscopy (AAS) on model samples clearly demonstrate that the errors are well within a reasonable limit of a few percents
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.10.013;
- PII
- S0168-583X(05)01786-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 243
- Journal Issue
- 2
- Journal Page Range
- p. 407-416
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37072787
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CORROSION; DEPOSITS; GEOMETRY; INKS; IRON; PENETRATION DEPTH; PIXE ANALYSIS; PROTON BEAMS; PROTONS; ROUGHNESS; SURFACES; X-RAY SPECTROSCOPY
- Descriptors DEC
- BARYONS; BEAMS; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; MATHEMATICS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; NUCLEONS; PARTICLE BEAMS; SPECTROSCOPY; SURFACE PROPERTIES; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.