Published 2010
| Version v1
Journal article
Pulse shape analysis with silicon microstrip detectors
Creators
- 1. Institut fuer Kernphysik, Technische Universitaet, Darmstadt (Germany)
- 2. GSI, Helmholtzzentrum fuer Schwerionenforschung GmbH (Germany)
- 3. Physik-Department, Technische Universitaet, Muenchen (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Pulsformanalyse mit Silizium-Mikrostreifendetektoren
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Bonn 2010 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(2)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 74. Annual meeting with ordinary general meeting of the DPG and 2010 Spring meeting with the professional associations extraterrestrial physics, gravitation and theory of relativity, hadrons and nuclei, particle physics, theoretical and mathematical fundamentals of the physics, the working teams equal opportunities, energy, the working groups information, young DPG, philosophy of the physics, physics and disarmament, symposia industry and book exhibition
- Original Conference Title
- 74. Jahrestagung mit Ordentlicher Mitgliederversammlung der DPG und Fruehjahrstagung 2010 mit den Fachverbaenden Extraterrestrische Physik, Gravitation und Relativitaetstheorie, Hadronen und Kerne, Teilchenphysik, Theoretische und Mathematische Grundlagen der Physik, den Arbeitskreisen Chancengleichheit, Energie, den Arbeitsgruppen junge DPG, Information, Philosophie der Physik, Physik und Abruestung, Symposien Industrie- und Buchausstellung
- Dates
- 15-19 Mar 2010
- Place
- Bonn (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 41126656
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ALPHA DETECTION; DATA ANALYSIS; ION DETECTION; MEV RANGE 01-10; PARTICLE DISCRIMINATION; PROTON DETECTION; PULSE TECHNIQUES; SI MICROSTRIP DETECTORS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ENERGY RANGE; MEASURING INSTRUMENTS; MEV RANGE; PARTICLE IDENTIFICATION; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- Session: HK 53.4 Do 17:30