Published March 1981
| Version v1
Report
Scanning electron microscope analysis of etch pits obtained in a muscovite Mica track detector by etching in HF and acqueous solution of NaOH
Creators
- 1. Pakistan Inst. of Nuclear Science and Technology, Rawalpindi. Nuclear Engineering Div.
- 2. Gesellschaft fuer Schwerionenforschung m.b.H., Darmstadt (Germany, F.R.)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Scientific report 1980
- Imprint Pagination
- 354 p.
- Journal Page Range
- p. 210.
- Report number
- GSI--81-2
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 13658165
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- AQUEOUS SOLUTIONS; CRYSTAL DEFECTS; DIELECTRIC TRACK DETECTORS; ELECTRON MICROSCOPY; ETCHING; GEV RANGE 01-10; HYDROFLUORIC ACID; KRYPTON 84 BEAMS; MUSCOVITE; PARTICLE TRACKS; PHYSICAL RADIATION EFFECTS; SODIUM HYDROXIDES
- Descriptors DEC
- ALKALI METAL COMPOUNDS; BEAMS; CRYSTAL STRUCTURE; DISPERSIONS; ENERGY RANGE; FLUORINE COMPOUNDS; GEV RANGE; HALOGEN COMPOUNDS; HOMOGENEOUS MIXTURES; HYDROGEN COMPOUNDS; HYDROXIDES; INORGANIC ACIDS; ION BEAMS; MEASURING INSTRUMENTS; MICA; MICROSCOPY; MINERALS; MIXTURES; OXYGEN COMPOUNDS; RADIATION DETECTORS; RADIATION EFFECTS; SODIUM COMPOUNDS; SOLUTIONS; SURFACE FINISHING
Optional Information
- Notes
- Published in summary form only.