Published September 27, 2009 | Version v1
Journal article

The Effect Of Spectral Lines Choice For Depth Profiling LIPS Experiment

  • 1. National Institute of Laser Enhanced Science (NILES), Cairo University (Egypt)
  • 2. Laser Research Institute (LRI), Physics Department, University of Stellenbosch (South Africa)

Description

Laser-induced Plasma spectroscopy (LIPS) is a useful method for determining the elemental composition of various materials but for long time it have been mainly restricted to qualitative and quantitative analysis of samples material. Recently LIPS is applied in addition to depth-profile analysis. In this paper we were trying to investigate the differences in the depth profile, obtained adopting femtosecond LIPS, that may occur on changing the spectral lines chosen for the analysis. The used femtosecond laser has pulse duration of 130 fs, wave length of 795 nm and pulse energy 200 μJ. It was found that the differences observed were not significant as long as the spectral lines chosen are fulfilling the LIPS spectral lines conditions.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1172
Journal Issue
1
Journal Page Range
p. 67-69
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
7. international conference on laser applications
Acronym
ICLA 2009
Dates
17-21 May 2009
Place
Cairo (Egypt)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41064054
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABLATION; CHARGE-COUPLED DEVICES; CHEMICAL COMPOSITION; DEPTH; EMISSION SPECTROSCOPY; LASER RADIATION; LASER-PRODUCED PLASMA; MULTI-ELEMENT ANALYSIS; PULSED IRRADIATION; QUANTITATIVE CHEMICAL ANALYSIS; THIN FILMS
Descriptors DEC
CHEMICAL ANALYSIS; DIMENSIONS; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; PLASMA; RADIATIONS; SEMICONDUCTOR DEVICES; SPECTROSCOPY

Optional Information

Notes
(c) 2009 American Institute of Physics