The fundamental parameter method for energy-dispersive X-ray fluorescence analysis of intermediate thickness samples with the use of monochromatic excitation
Creators
- 1. Institute of Physics and Nuclear Techniques, Cracow (Poland)
Description
The fundamental parameter method for correction for enhancement and absorption effects in the energy-dispersive x-ray fluorescence analysis of intermediate thickness samples using monochromatic excitation was evaluated. A simple means for the calculation of the concentration of an element in an unknown sample without using the iterative approach is proposed. Based on the derived equation, the influence of the higher Ζ sample components and their concentration levels on the enhancement correction factor was examined theoretically and tested experimentally. The concentration of an interfering element was found to have a stronger influence on the enhancement correction factor than the concentration level of the determined element. The method was tested experimentally using various two-element standard samples and reference materials. The calculated concentrations were in good agreement with the known values. (Author)
Additional details
Publishing Information
- Journal Title
- X-Ray Spectrometry, XRS
- Journal Volume
- 22
- Journal Issue
- 2
- Journal Page Range
- p. 80-85.
- ISSN
- 0049-8246
- CODEN
- XRSPAX
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 24052601
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CALIBRATION STANDARDS; CORRECTIONS; EXCITATION; INTERFERING ELEMENTS; QUANTITATIVE CHEMICAL ANALYSIS; TITANIUM; X-RAY FLUORESCENCE ANALYSIS; ZINC
- Descriptors DEC
- CHEMICAL ANALYSIS; ELEMENTS; ENERGY-LEVEL TRANSITIONS; METALS; NONDESTRUCTIVE ANALYSIS; STANDARDS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS