Completely inverted hysteresis loops: Inhomogeneity effects or experimental artifacts
Creators
- 1. Key Laboratory of Advanced Materials (MOE), School of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China)
- 2. Center for Testing and Analyzing of Materials, School of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China)
Description
Completely inverted hysteresis loops (IHL) are obtained by the superconducting quantum interference device with large cooling fields (>10 kOe) in (La,Sr)MnO3 films with self-assembled LaSrMnO4, an antiferromagnetic interface. Although the behaviours of measured loops show many features characteristic to the IHL, its origin, however, is not due to the exchange coupling between (La,Sr)MnO3/LaSrMnO4, an often accepted view on IHL. Instead, we demonstrate that the negative remanence arises from the hysteresis of superconducting coils, which drops abruptly when lower cooling fields are utilized. Hence the completely inverted hysteresis loops are experimental artifacts rather than previously proposed inhomogeneity effects in complicated materials
Additional details
Identifiers
- DOI
- 10.1063/1.4830011;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 114
- Journal Issue
- 18
- Journal Page Range
- p. 183906-183906.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45078974
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANTIFERROMAGNETISM; COOLING; COUPLING; HYSTERESIS; MANGANESE OXIDES; SQUID DEVICES; SUPERCONDUCTING COILS
- Descriptors DEC
- CHALCOGENIDES; ELECTRIC COILS; ELECTRICAL EQUIPMENT; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MAGNETISM; MANGANESE COMPOUNDS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; OXIDES; OXYGEN COMPOUNDS; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC