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Published July 2019 | Version v1
Journal article Metadata-only

Structural and chemical investigation of interface related magnetoelectric effect in Ni/BiFe0.95Mn0.05O3 heterostructures

Creators

  • 1. GREMAN, UMR 7347, Université de Tours, CNRS, Parc de Grandmont, 37200 Tours (France)
  • 2. ICMN, UMR7374, Université d'Orléans, CNRS, Rue de la Férollerie, 45071 Orléans (France)
  • 3. Université de Toulouse, 29 Rue Jeanne Marvig, F-31055 Toulouse (France)
  • 4. CEMES CNRS, 29 Rue Jeanne Marvig, F-31055 Toulouse (France)
  • 5. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich 52425 (Germany)

Description

The magnetoelectric coupling mechanism in Ni/BiFe0.95Mn0.05O3 heterostructures is investigated through a detailed microstructural study of the BiFe0.95Mn0.05O3 film and a chemical analysis of the Ni/BiFe0.95Mn0.05O3 interface. The four structural variants expected in BiFe0.95Mn0.05O3 are detected by high resolution X-ray diffraction reciprocal space mapping method. The ferroelectric domain structure is imaged with transmission electron microscopy. Oxidized Ni is evidenced at the Ni/BiFe0.95Mn0.05O3 interface by electron energy loss spectroscopy and X-ray photoemission spectroscopy, although the degree of Ni oxidation is independent of the magnetoelectric state of the heterostructure.

Additional details

Identifiers

DOI
10.1016/j.apsusc.2019.02.232;
PII
S0169433219305896;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
481
Journal Page Range
p. 234-240
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55048439
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CHEMICAL ANALYSIS; DOMAIN STRUCTURE; ELECTRICAL PROPERTIES; ELECTRONS; ENERGY-LOSS SPECTROSCOPY; FERROELECTRIC MATERIALS; MAGNETIC PROPERTIES; MICROSTRUCTURE; OXIDATION; PHOTOELECTRON SPECTROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
CHEMICAL REACTIONS; COHERENT SCATTERING; DIELECTRIC MATERIALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; FILMS; IONIZING RADIATIONS; LEPTONS; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.