L-edge spectroscopy of dilute, radiation-sensitive systems using a transition-edge-sensor array
Creators
- 1. Stanford University, CA (United States). Dept. of Physics
- 2. Stanford University, CA (United States). Dept. of Chemistry
- 3. SLAC National Accelerator Laboratory, Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource
- 4. SLAC National Accelerator Laboratory, Menlo Park, CA (United States)
- 5. National Institute of Standards and Technology, Boulder, CO (United States)
Description
Here, we present X-ray absorption spectroscopy and resonant inelastic X-ray scattering (RIXS) measurements on the iron L-edge of 0.5 mM aqueous ferricyanide. These measurements then demonstrate the ability of high-throughput transition-edge-sensor (TES) spectrometers to access the rich soft X-ray (100–2000 eV) spectroscopy regime for dilute and radiation-sensitive samples. Our low-concentration data are in agreement with high-concentration measurements recorded by grating spectrometers. These results show that soft-X-ray RIXS spectroscopy acquired by high-throughput TES spectrometers can be used to study the local electronic structure of dilute metal-centered complexes relevant to biology, chemistry, and catalysis. In particular, TES spectrometers have a unique ability to characterize frozen solutions of radiation- and temperature-sensitive samples.
Availability note (English)
Available from http://www.osti.gov/pages/biblio/1417291; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo periodAdditional details
Identifiers
- DOI
- 10.1063/1.5000755;
Publishing Information
- Journal Title
- Journal of Chemical Physics
- Journal Volume
- 147
- Journal Issue
- 21
- Journal Page Range
- vp.
- ISSN
- 0021-9606
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 49059793
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ELECTRONIC STRUCTURE; SOFT X RADIATION; SPECTROMETERS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS; SCATTERING; SPECTROSCOPY; X RADIATION
Optional Information
- Contract/Grant/Project number
- R01GM040392; AC02-76SF00515
- Funding organization
- USDOE Office of Science - SC, Basic Energy Sciences (BES) (SC-22) (United States)
- Secondary number(s)
- OSTIID--1417291