Published September 2003 | Version v1
Journal article

Quantitative valence plasmon mapping in the TEM: viewing physical properties at the nanoscale

Description

Using a series of graphitising carbons heat treated at different temperatures, the peak position of the bulk (π+σ) plasmon was measured using electron energy loss spectroscopy and observed to shift between 22 and 27 eV. Experimental data is presented and discussed showing the effects of the collection conditions and sample orientation upon the observed spectra. We present an empirical technique by which quantitative energy filtered transmission electron microscopy (EFTEM) maps with two energy windows selected in the plasmon region can be readily acquired and processed, the results of which may be interpreted as graphitisation maps and subsequently physical property maps. An experimentally established resolution of ∼1.6 nm makes this technique a very useful tool with which to examine nanoscale properties in microstructural regions of interest in TEM specimens such as fibre/matrix interfaces within carbon-carbon composites, multi-walled carbon nanotubes and graphitic inclusions in carbon steels. Also presented is data demonstrating the unsuitability of π*-related chemical EFTEM maps in both the low-loss region and at the carbon K ionisation edge for mapping bonding in such highly anisotropic media due to the strong orientation dependence of the intensity of the transitions involved. This is followed by suggestions for wider application of the plasmon mapping technique within systems other than those based upon carbon

Additional details

Identifiers

DOI
10.1016/S0304-3991;
PII
S0304399103001153;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
96
Journal Issue
3-4
Journal Page Range
p. 547-558
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
International workshop on strategies and advances in atomic level spectroscopy and analysis
Dates
5-9 May 2002
Place
Guadeloupe, French West Indies (France)

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.