Transparent conducting Sc-codoped AZO film prepared from ZnO:Al-Sc by RF-DC sputtering
Creators
Description
Al and Sc-codoped zinc oxide (also expressed as Sc-codoped AZO or ZnO:Al-Sc) films were sputtered on STN glass using RF power sources on ZnO and DC power sources on Al-1.7wt.% Sc alloy. X-ray diffraction (XRD) of the codoped films displayed that they are crystalline and textured at (002) and (103). Examination through transmission electron microscopy (TEM) depicted that these films consists of columnar grains. X-ray photoelectron spectroscopy (XPS) analysis of the films indicated that the O1s comprises O(I), O(II), O(III), and O(IV). The component O(I) centered at 530.00 ± 0.15eV was attributable to Sc2O3; the O(III) at 531.25 ± 0.20eV was to the oxygen deficient regions within the matrix of ZnO. The transmittance of visible light (i.e., wavelength in the range from 400 to 800nm) for the film was higher than 80%. The electrical resistivity is lower (1.76 < 2.81Ω-cm), the corrosion-resistance in 3.5% NaCl solution is better for the codoped film in comparison with the usual AZO. Heat treatment of the films (at 200-400oC for 1h) improved the optical transmittance, electrical conductivity, and corrosion-resistance in saline solution
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2007.07.096Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2007.07.096;
- PII
- S0040-6090(07)01163-7;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 16
- Journal Page Range
- p. 5349-5354
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- International conference on technological advances of thin films and surface coatings
- Acronym
- Thin films 2006
- Dates
- 11-15 Dec 2006
- Place
- Singapore (Singapore)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40005757
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ALLOYS; ANNEALING; CORROSION; CORROSION RESISTANCE; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; FILMS; GLASS; SCANDIUM ALLOYS; SCANDIUM OXIDES; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; HEAT TREATMENTS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCANDIUM COMPOUNDS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.