Published June 2020 | Version v1
Report Restricted

Moessbauer spectroscopy of spin crossover complex Fe(3-cyano-4-methylpyridine)2[Ag(CN)2]2

Creators

  • 1. Toho University, Graduate School of Science, Funabashi, Chiba (Japan)
  • 2. Tokyo Denki University, Faculty of Science and Engineering, Tokyo (Japan)
  • 3. Toho University, Faculty of Science, Funabashi, Chiba (Japan)

Description

no abstract available

Files

Restricted

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Part of:
Proceedings of the specialists' meeting on 'nuclear spectroscopy and condensed matter physics using short-lived nuclei 6' and meeting on '11th nuclear spectroscopy research using stop and slow unstable nuclei (SSRI)'

Additional details

Additional titles

Original title (Japanese)
スピンクロスオーバー錯体Fe(3-cyano-4- methylpyridine)2[Ag(CN)2]2のメスバウアー分光

Identifiers

URL
https://www.rri.kyoto-u.ac.jp/PUB/report/09_kurns/temp/kurns-ekr-008.pdf;

Publishing Information

Imprint Title
Proceedings of the specialists' meeting on 'nuclear spectroscopy and condensed matter physics using short-lived nuclei 6' and meeting on '11th nuclear spectroscopy research using stop and slow unstable nuclei (SSRI)'
Imprint Pagination
[101 p.]
Journal Page Range
p. 51-54
Report number
KURNS-EKR--8

Conference

Title
6. specialists' meeting on 'nuclear spectroscopy and condensed matter physics using short-lived nuclei'; 11. meeting on 'nuclear spectroscopy research using stop and slow unstable nuclei (SSRI)'
Dates
16-17 Jan 2020
Place
Kumatori, Osaka (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
52059582
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
BOND LENGTHS; COMPLEXES; CRYSTAL STRUCTURE; HIGH SPIN STATES; LIGANDS; MAGNETIZATION; MOESSBAUER SPECTROMETERS; SPIN FLIP; SQUID DEVICES; TEMPERATURE DEPENDENCE; THERMAL GRAVIMETRIC ANALYSIS; TRANSITION TEMPERATURE; X-RAY DIFFRACTION
Descriptors DEC
CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTRONIC EQUIPMENT; ENERGY LEVELS; EQUIPMENT; FLUXMETERS; GAMMA SPECTROMETERS; GRAVIMETRIC ANALYSIS; LENGTH; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SPECTROMETERS; SUPERCONDUCTING DEVICES; THERMAL ANALYSIS; THERMODYNAMIC PROPERTIES

Optional Information

Notes
19 refs., 4 figs. Imprint:#4EE4##548C##5143##5E74##5EA6##300C##77ED##5BFF##547D#RI #3092##7528##3044##305F##6838##5206##5149##3068##6838##7269##6027##7814##7A76#VI#300D##517C##300C##7B2C#11#56DE# #505C##6B62##30FB##4F4E##901F#RI #30D3##30FC##30E0##3092##7528##3044##305F##6838##5206##5149##7814##7A76##FF08#SSRI#FF09##300D#