Particle deposition to smooth and rough walls of stirred chambers: mechanisms and engineering correlations

Using data from the literature, we have obtained Sherwood-Reynolds-Schmidt number correlations for particle deposition in stirred chambers with both smooth and rough surfaces. The results for smooth walls compare well with correlations obtained by previous investigators for heat and mass transfer in stirred chambers with smooth walls. Deposition data for rough surfaces show a transition from smooth to rough behavior, depending on the ratio of the roughness height to the thickness of the diffusion layer. A new method for correlating the data, based on theory, is presented. (author)