Published November 1, 2010
| Version v1
Journal article
Physical deposition of thin polyimide layers by applying an argon plasma assisted process
Creators
Description
A novel method for physical deposition of thin polyimide layers by applying an argon plasma assisted process has been developed. The influence of the plasma on the combined molecular flux of the two thermally evaporated precursors - 4,4'- oxydianiline and pyromellitic dianhydride was investigated. The process parameters were changed in the limlts 0,4 - 2 A for the anode current and 80 - 170 V for the anode voltage. Their influence was studied using FTIR spectroscopy and electron microscopy techniques. It was proposed that the plasma flux crossing the molecular flows of the polyimide precursors enhances the imidization process by partly activating the precursor molecules in the gas phase.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/253/1/012049Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 253
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 16. international school on condensed matter physics - Progress in solid state and molecular electronics, ionics and photonics
- Acronym
- 16 ISCMP
- Dates
- 29 Aug - 3 Sep 2010
- Place
- Varna (Bulgaria)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42053662
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; DEPOSITION; ELECTRIC POTENTIAL; ELECTRON MICROSCOPY; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; LAYERS; MOLECULES; PLASMA; SPECTROSCOPY; THIN FILMS
- Descriptors DEC
- ELEMENTS; FILMS; FLUIDS; GASES; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; RARE GASES; SPECTRA; SPECTROMETERS