Published September 1995 | Version v1
Report

100 Mrad radiation tolerant CMOS devices

  • 1. AEA Technology, Harwell (United Kingdom). Telerobotic Systems

Description

Test transistors and a complete mixed signal integrated circuit, fabricated in the Harris AVLSI-RA process, have been irradiated and shown to function well at total doses greater than 100 Mrad (1 MGy). Results are presented. (author)

Availability note (English)

Available from Rutherford Appleton Laboratory, Chilton. OX11 0QX.

Additional details

Publishing Information

Imprint Pagination
4 p.
Report number
RAL-TR--95-055

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
27016106
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ELECTRONIC EQUIPMENT; GAMMA RADIATION; IRRADIATION; MOS TRANSISTORS; NUCLEAR INDUSTRY; PHYSICAL RADIATION EFFECTS; RADIATION DOSES
Descriptors DEC
ELECTROMAGNETIC RADIATION; EQUIPMENT; INDUSTRY; IONIZING RADIATIONS; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; TRANSISTORS