Published April 1995 | Version v1
Report Metadata-only

Rate and lifetime characteristics of a gas microstrip detector fabricated on thin D263 glass

Creators

  • 1. Rutherford Appleton Lab., Chilton (United Kingdom)
  • 2. VTT Electronics, Espoo (Finland)

Description

The rate and aging characteristics of a gas microstrip detector fabricated on thin (200μm) borosilicate glass (D263) are reported. The use of a high drift field (7kV/cm) and a back electrode at the same potential as the anode led to promising rate and short-term aging characteristics. In the longer term, however, the effects of ion movement in the substrate have been found to be very deleterious. (Author)

Availability note (English)

Available from Rutherford Appleton Laboratory, Chilton, Oxon. OX11 0QX.

Additional details

Publishing Information

Imprint Pagination
11 p.
Report number
RAL--95-038

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
26071866
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data, Non-conventional Literature
Descriptors DEI
BOROSILICATE GLASS; DRIFT CHAMBERS; EXPERIMENTAL DATA; FABRICATION; LIFETIME; PERFORMANCE
Descriptors DEC
DATA; GLASS; INFORMATION; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBERS; NUMERICAL DATA; PROPORTIONAL COUNTERS; RADIATION DETECTORS