Published April 2014
| Version v1
Journal article
Effect of metal electrode on characteristics of gamma-irradiated silicon carbide detector
Creators
- 1. Dept. of Nuclear Engineering, Hanyang Univ., Seoul (Korea, Republic of)
- 2. Nonproliferation System Research Division, Korea Atomic Energy Research Inst., Daejeon (Korea, Republic of)
- 3. Ionizing Radiation Group, Korea Research Inst. of Standards and Science, Daejeon (Korea, Republic of)
- 4. Nuclear Systems Division, School of Mechanical Engineering, Pusan National Univ., Busan (Korea, Republic of)
Description
Silicon carbide (SiC) is a highly promising semiconductor neutron-detector material for harsh environments such as nuclear reactor cores and spent-fuel storage pools. In the present study, three 4H–SiC p–i–n diode detectors were fabricated as variations of those metal-electrode structures. The I–V characteristics and alpha-particle responses of the detectors were measured before and after gamma-ray exposure. The detector with a Ti/Au electrode showed the lowest change of leakage current after irradiation; none of the detectors showed any change in the charge-collection efficiency when a sufficient electric field was applied after gamma irradiation of up to 8.1 MGy. (author)
Availability note (English)
Available from http://dx.doi.org/10.1080/00223131.2014.875956Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nuclear Science and Technology (Tokyo)
- Journal Volume
- 51
- Journal Issue
- 4
- Journal Page Range
- p. 482-486
- ISSN
- 0022-3131
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 45088403
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGE COLLECTION; ELECTRODES; GAMMA RADIATION; LEAKAGE CURRENT; METALS; NEUTRON DETECTORS; PERFORMANCE TESTING; POST-IRRADIATION EXAMINATION; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SILICON CARBIDES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CURRENTS; ELECTRIC CURRENTS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SILICON COMPOUNDS; TESTING
Optional Information
- Notes
- 16 refs., 6 figs.