Published October 2014 | Version v1
Journal article

Analysis of surface absorbed dose in X-ray grating interferometry

  • 1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026 (China)
  • 2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)

Description

Highlights: • Theoretical framework for dose estimation in X-ray grating interferometry. • Potential dose reduction of X-ray grating interferometry compared to conventional radiography. • Guidelines for optimization of X-ray grating interferometry for dose-sensitive applications. • Measure to compare various existing X-ray phase contrast imaging techniques. - Abstract: X-ray phase contrast imaging using grating interferometry has shown increased contrast over conventional absorption imaging, and therefore the great potential of dose reduction. The extent of the dose reduction depends on the geometry of grating interferometry, the photon energy, the properties of the sample under investigation and the utilized detector. These factors also determine the capability of grating interferometry to distinguish between different tissues with a specified statistical certainty in a single raw image. In this contribution, the required photon number for imaging and the resulting surface absorbed dose are determined in X-ray grating interferometry, using a two-component imaging object model. The presented results confirm that compared to conventional radiography, phase contrast imaging using grating interferometry indeed has the potential of dose reduction. And the extent of dose reduction is strongly dependent on the imaging conditions. Those results provide a theoretical framework for dose estimation under given imaging conditions before experimental trials, and general guidelines for optimization of grating interferometry for those dose-sensitive applications

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2014.04.010

Additional details

Identifiers

DOI
10.1016/j.elspec.2014.04.010;
PII
S0368-2048(14)00094-2;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
196
Journal Page Range
p. 85-88
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
38. international conference on vacuum ultraviolet and X-ray physics
Acronym
VUVX2013
Dates
12-19 Jul 2013
Place
Hefei (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46090708
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORBED RADIATION DOSES; ABSORPTION; COMPARATIVE EVALUATIONS; IMAGES; INTERFEROMETRY; OPTIMIZATION; PHOTONS; POTENTIALS; SURFACES; X RADIATION
Descriptors DEC
BOSONS; DOSES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EVALUATION; IONIZING RADIATIONS; MASSLESS PARTICLES; RADIATION DOSES; RADIATIONS; SORPTION

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.