Analysis of surface absorbed dose in X-ray grating interferometry
- 1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026 (China)
- 2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)
Description
Highlights: • Theoretical framework for dose estimation in X-ray grating interferometry. • Potential dose reduction of X-ray grating interferometry compared to conventional radiography. • Guidelines for optimization of X-ray grating interferometry for dose-sensitive applications. • Measure to compare various existing X-ray phase contrast imaging techniques. - Abstract: X-ray phase contrast imaging using grating interferometry has shown increased contrast over conventional absorption imaging, and therefore the great potential of dose reduction. The extent of the dose reduction depends on the geometry of grating interferometry, the photon energy, the properties of the sample under investigation and the utilized detector. These factors also determine the capability of grating interferometry to distinguish between different tissues with a specified statistical certainty in a single raw image. In this contribution, the required photon number for imaging and the resulting surface absorbed dose are determined in X-ray grating interferometry, using a two-component imaging object model. The presented results confirm that compared to conventional radiography, phase contrast imaging using grating interferometry indeed has the potential of dose reduction. And the extent of dose reduction is strongly dependent on the imaging conditions. Those results provide a theoretical framework for dose estimation under given imaging conditions before experimental trials, and general guidelines for optimization of grating interferometry for those dose-sensitive applications
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2014.04.010Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2014.04.010;
- PII
- S0368-2048(14)00094-2;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 196
- Journal Page Range
- p. 85-88
- ISSN
- 0368-2048
- CODEN
- JESRAW
Conference
- Title
- 38. international conference on vacuum ultraviolet and X-ray physics
- Acronym
- VUVX2013
- Dates
- 12-19 Jul 2013
- Place
- Hefei (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46090708
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORBED RADIATION DOSES; ABSORPTION; COMPARATIVE EVALUATIONS; IMAGES; INTERFEROMETRY; OPTIMIZATION; PHOTONS; POTENTIALS; SURFACES; X RADIATION
- Descriptors DEC
- BOSONS; DOSES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EVALUATION; IONIZING RADIATIONS; MASSLESS PARTICLES; RADIATION DOSES; RADIATIONS; SORPTION
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.