Published July 15, 2013
| Version v1
Journal article
Improvement of graphene quality synthesized by cluster ion implantation
- 1. School of Physics and Technology and Key Laboratory of Artificial Micro- and Nano-Materials of Ministry of Education, Wuhan University, Wuhan 430072 (China)
- 2. Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Beijing Normal University, Beijing 100875 (China)
Description
Graphene was prepared by negative C4 cluster ion implantation at 5 keV/atom followed by vacuum thermal annealing and cooling. The surface morphology and structure of samples were studied by scanning electron microscopy, atomic force microscopy, and Raman spectroscopy. Improvement of the graphene quality was realized by optimization of the post thermal processes. 1–2 layer graphene was obtained with I2D/IG ratio of 1.43 and ID/IG ratio of 0.07 at the implantation dose of 12 × 1015 atoms/cm2 and annealed at 900 °C followed by cooling at 20 °C/min
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2012.11.075Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2012.11.075;
- PII
- S0168-583X(13)00087-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 307
- Journal Page Range
- p. 260-264
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 18. international conference on ion beam modifications of materials
- Acronym
- IBMM2012
- Dates
- 2-7 Sep 2012
- Place
- Qingdao (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065273
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMS; COOLING; DOSES; GRAPHENE; IODINE; ION IMPLANTATION; ION PAIRS; KEV RANGE; OPTIMIZATION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- CARBON; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; HALOGENS; HEAT TREATMENTS; LASER SPECTROSCOPY; MICROSCOPY; NONMETALS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.